Achieve Sharper Raman-based Microparticle Characterisation

WITec GmbH, the pace-setting leader in Raman microscope technology, has enhanced its ParticleScout automated particle analysis tool to offer even greater speed and versatility for finding, classifying and identifying microparticles.

ParticleScout现在包括了积分时间优化，它使用信噪比来确定每个粒子被测量多长时间用于识别。这不仅大大减少了整体测量时间，而且最大限度地减少了荧光的影响。

“The first release of ParticleScout was a response to the general demand for a microparticle analysis system built around Raman spectroscopy,” said Harald Fischer, Marketing Director at WITec. “This version is driven by direct feedback from researchers and their specific requirements in laboratories focused on environmental research, food science, pharmaceutics and many other applications.”

The enhanced ParticleScout has added image processing features such as vignetting correction, smart zoom that displays particle information dynamically depending on viewed area, and multiple sample area targeting. These conveniences are complemented by the integration and possible combination of dark-field, bright-field, epifluorescence and transmission sample illumination.

A software routine has been introduced to accelerate measurements of round samples such as filters that contain homogeneously distributed particles. It allows a wedge section to be selected for analysis and the results can then be extrapolated to represent the whole. Another innovation is the smart separation of closely adjacent or touching particles. This is especially useful for densely packed, heterogeneous samples.

Data post-processing with WITec’s TrueMatch™ Raman database management software is updated as well, including the ability to identify individual components in mixed spectra. Hit quality index (HQI) calculation is also optimised with automatic noise reduction and substrate spectra removal. Together these advances enable a new degree of precision in sample characterisation.

最后，总结ParticleScout调查结果的定量报告现在可以使用预先配置的模板进行格式化，例如表格、柱状图或饼图，以便清晰有效地显示数据。

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